Auger Electron Spectroscopy: Practical Application to by John Wolstenholme

By John Wolstenholme

This publication discusses using Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a variety of technological fabrics, together with, metals and alloys, semiconductors, nanostructures, and insulators. Its price as a device for high-resolution elemental imaging and compositional intensity profiling is illustrated and theĀ application of the procedure for acquiring compositional info from the surfaces, interfaces, and skinny movie constructions of technological and engineering fabrics is confirmed. This quantity additionally describes the fundamental actual rules of AES in uncomplicated, principally qualitative phrases. significant parts of commonplace Auger spectrometers also are defined. The ebook discusses different kinds of research for which an Auger electron spectrometer can be used, for instance, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, in addition to the connection among AES and different research options.

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Additional info for Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films

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4 days) then it will decay by electron capture to an excited state of 125Te which further decays with the emission of 35 keV gamma rays. The emitted gamma rays cause the ionization of the molecule which then relaxes by the emission of a total of 21 Auger electrons in the energy range 50 to 500 eV. As with other forms of radiation therapy, Auger electrons damage the targeted cancer cells, including the DNA, in order to stop cell division and tumor growth. The mean free path of electrons having an energy in this range is so short that there is little or no damage to the cells surrounding the targeted cell.

The dots indicate the kinetic energy of the most intense peak in the group and the lines show the minimum and maximum kinetic energy of transitions in the group. Neither of these approaches, however, gives a clear indication of the trends in kinetic energy that occur with increasing atomic number. 10, which shows data from many of the KLL, LMM, and MMN transitions. In each case, the dots show the energy of the most intense transition in each group and the lines show the minimum and maximum energies for that group of transitions.

In principle, this depth profiling technique can be used to analyze the solid upto any depth but, in practice, analysts do not use it for depths greater than a few microns because of the time required to measure a profile to greater depths plus complicating artifacts that get worse as a function of depth (see later). For the analysis of deeper features, techniques such as in situ fracturing, surface lapping or ball cratering are often used in combination with AES analysis. AES is named after Pierre Auger, who was a French physicist.

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