Applied Scanning Probe Methods VIII: Scanning Probe by Pietro Giuseppe Gucciardi, Guillaume Bachelier (auth.),
By Pietro Giuseppe Gucciardi, Guillaume Bachelier (auth.), Bharat Bhushan, Harald Fuchs, Masahiko Tomitori (eds.)
The good fortune of the Springer sequence utilized Scanning Probe equipment I–VII and the swiftly increasing actions in scanning probe improvement and functions world wide made it a usual step to assemble additional speci c ends up in the elds of improvement of scanning probe microscopy innovations (Vol. VIII), characterization (Vol. IX), and biomimetics and commercial functions (Vol. X). those 3 volumes supplement the former set of volumes less than the topic subject matters and provides perception into the hot paintings of major experts of their respective elds. Following the culture of the sequence, the chapters are prepared round ideas, characterization and biomimetics and commercial functions. quantity VIII specializes in novel scanning probe suggestions and the certainty of tip/sample interactions. themes contain close to eld imaging, complex AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever platforms, combos of AFM sensors and scanning electron and ion microscopes, calibration equipment, frequency modulation AFM for program in beverages, Kelvin probe strength microscopy, scanning capacitance microscopy, and the size of electric delivery houses on the nanometer scale. Vol. IX specializes in characterization of fabric surfaces together with structural in addition to neighborhood mechanical characterization, and molecular platforms. the quantity covers a wide spectrum of STM/AFM investigations together with fullerene layers, strength spectroscopy for probing fabric houses in most cases, organic lms .and cells, epithelial and endothelial layers, scientific similar platforms akin to amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical homes ofpolymernanostructures, technical polymers, and close to eld optics.
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Extra info for Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques
83 Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum Laurent Nony, Enrico Gnecco, Ernst Meyer . . . . . . . 131 One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures Luca Gavioli, Massimo Sancrotti . . . . . . . . . . 183 Scanning Probe Microscopy Applied to Ferroelectric Materials Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini . . . 217 Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy Renato Buzio, Ugo Valbusa .
It Guillaume Bachelier Laboratoire de Spectrométrie Ionique et Moléculaire (LASIM) Université Claude Bernard – Lyon 1, Bât. A. fr Bharat Bhushan Nanotribology Lab for Information Storage and MEMS/NEMS (NLIM) The Ohio State University 201 W. fr Anne Marie Bonnot LEPES 25 av. fr P. es Eugenio Cefalì Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate Università di Messina Salita Sperone n. uk Peter J. uk Gregory A. com Horacio D. za L. it Renato Gardelli Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate Università di Messina Salita Sperone n.
205 Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale Pascal Vairac, Bernard Cretin . . . . . . . . . . 241 Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices Paul Girard, Alexander Nikolaevitch Titkov . . . . . . . 283 8 9 10 Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, Maria Allegrini .